To ensure customers receive high-quality products, engineers must consider testing strategies before they even think about a schematic diagram. These days, most engineers realize boundary scan ...

Boundary scan offers clear advantages over technologies that require physical contact with a unit under test. It is also useful for ferreting out faults among the expensive, advanced semiconductor ...

Despite its standardization as IEEE 1149.1 in 1990 and wide use in the industry, many test engineers and developers still do not fully understand the benefits of boundary scan test. The misconceptions ...

For decades, process and design scaling has triggered the adoption of transformative test solutions. About twenty years ago, when at-speed test became a de-facto requirement, on-chip compression ...

As design size and complexity increase, so too does the cost of test. Both the design community and the test industry are looking at various approaches to lower the cost of manufacturing test. This ...

Some new design-for-test (DFT) technologies are difficult, expensive, or risky to implement but offer significant benefits. Other technologies are easy to implement but offer minor improvements. The ...